Testing embedded systems is extremely different from classical testing. First of all, there are quite a few non-standard platforms for embedded systems. Secondly, frequently no test tools or the tests themselves cannot be installed on the device and/or embedded platform. Additionally, the system under test doesn’t wait while its tested. The time to execute a series of operations takes less than a hundred of a second, and a number of tests must be run in this time.
To solve these challenges, we use external boards (carrier-boards) or various IP-KVM devices to send commands to the system under test. Generally, we develop a framework and “harness” for each embedded device in order to run automated tests.
We have two areas for automated testing of embedded systems:
When testing we use our internal tools to store and analyze data (a Neuron-R system), but we use enterprise systems to generate data. Storing and analyzing the test results using a Neuron-R allows us to generate reports, view past results, and assess aggregate metrics in real-time on a single chart, which makes it possible to see the correlation between input and output parameters. This is an important ability when testing embedded systems and devices.